CT Lab GX

Product details

CT Lab GX

產品說明

Introducing the CT Lab GX series, for ultra-high-speed, high-resolution 3D X-ray micro CT. Using the Sample-Stationary Method, these new devices can perform CT scans in 8 seconds at top speed, with a minimum resolution of 2.3 μm.

Product name	CT Lab GX
Technique	X-ray computed tomography scanner
Benefit	Ultra-high-speed, high-resolution 3D X-ray micro CT
Technology	X-ray source with flat panel detector
Core attributes	Perform CT scans in 8 seconds at top speed, with a minimum resolution of 2.3 μm
Core options	90 kV or 130 kV X-ray source
Computer	External PC, MS Windows® OS,
Core dimensions	980 (W) x 1535 (H) x 963 (D) (mm)
Mass (core unit)	450 kg
Power requirements	Varies with configuration

產品特點

BGA Crack檢測，如孔隙率、異物率，座標量測。
IC晶片缺陷檢測，如孔洞、氣泡、層剝離、爆裂、空洞、打線完整性檢測。
PCB製程中可能產生的缺陷，如﹕對齊不良或橋接以及開路。
SMT焊點空洞現象檢測。
電源線中可能產生的斷線、短路等缺陷檢測。
錫球與晶片陣列封裝中錫球的完整性檢測。
晶片尺寸量測、打線線弧量測、元件吃錫面積比例量測。
航太、軍事、電池、合金、壓鑄、電子零件等缺陷檢測。
醫療器材、骨材、生醫材料等非破壞性檢測。
藥物、膠囊、藥錠、飲品等，內容物分布之非破壞性檢測。
塑膠材質破裂或金屬材質空洞檢測。

參考影片

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